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Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems

Publication ,  Conference
Pan, R; Li, X; Chakrabarty, K
Published in: Proceedings of the IEEE VLSI Test Symposium
January 1, 2022

The increasing complexity of integrated systems has exacerbated the challenges associated with system diagnosis. To tackle these challenges, intelligent root-cause-analysis facilitated by machine learning has been proposed in recent years. However, most of these methods rely on a large amount of data with root-cause labels, which are often either not available or difficult to obtain. In this paper, we propose a semi-supervised root-cause-analysis method with co-training, where only a small set of labeled data is required. Using random forest as the learning kernel, a co-training technique is proposed to leverage the unlabeled data by automatically pre-labeling a subset of them and retraining each decision tree. In addition, several novel techniques are proposed to avoid over-fitting and determine hyper-parameters. Two case studies based on industrial designs demonstrate that the proposed approach significantly outperforms state-of-the-art methods by saving up to 43% of labeling efforts by human experts.

Duke Scholars

Published In

Proceedings of the IEEE VLSI Test Symposium

DOI

Publication Date

January 1, 2022

Volume

2022-April
 

Citation

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Pan, R., Li, X., & Chakrabarty, K. (2022). Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems. In Proceedings of the IEEE VLSI Test Symposium (Vol. 2022-April). https://doi.org/10.1109/VTS52500.2021.9794192
Pan, R., X. Li, and K. Chakrabarty. “Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems.” In Proceedings of the IEEE VLSI Test Symposium, Vol. 2022-April, 2022. https://doi.org/10.1109/VTS52500.2021.9794192.
Pan R, Li X, Chakrabarty K. Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems. In: Proceedings of the IEEE VLSI Test Symposium. 2022.
Pan, R., et al. “Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems.” Proceedings of the IEEE VLSI Test Symposium, vol. 2022-April, 2022. Scopus, doi:10.1109/VTS52500.2021.9794192.
Pan R, Li X, Chakrabarty K. Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems. Proceedings of the IEEE VLSI Test Symposium. 2022.

Published In

Proceedings of the IEEE VLSI Test Symposium

DOI

Publication Date

January 1, 2022

Volume

2022-April