Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch
Publication
, Journal Article
Wu, K; Guo, N; Li, F; Zhu, N; Tao, J; Li, X
Published in: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
May 1, 2023
In this article, we propose an efficient statistical parameter extraction method to accurately model the random device mismatch of MOSFETs. The key idea is to approximate the performance variations as mathematical functions of device mismatch. Based on these approximated functions and the electrical test data, we solve the unknown statistical parameters by nonlinear optimization. Our numerical experiments demonstrate that the proposed method can remarkably improve the modeling accuracy with affordable computational cost, compared against the state-of-the-art techniques.
Duke Scholars
Published In
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI
EISSN
1937-4151
ISSN
0278-0070
Publication Date
May 1, 2023
Volume
42
Issue
5
Start / End Page
1618 / 1622
Related Subject Headings
- Computer Hardware & Architecture
- 4607 Graphics, augmented reality and games
- 4009 Electronics, sensors and digital hardware
- 1006 Computer Hardware
- 0906 Electrical and Electronic Engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Wu, K., Guo, N., Li, F., Zhu, N., Tao, J., & Li, X. (2023). Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 42(5), 1618–1622. https://doi.org/10.1109/TCAD.2022.3204716
Wu, K., N. Guo, F. Li, N. Zhu, J. Tao, and X. Li. “Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 42, no. 5 (May 1, 2023): 1618–22. https://doi.org/10.1109/TCAD.2022.3204716.
Wu K, Guo N, Li F, Zhu N, Tao J, Li X. Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2023 May 1;42(5):1618–22.
Wu, K., et al. “Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch.” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 42, no. 5, May 2023, pp. 1618–22. Scopus, doi:10.1109/TCAD.2022.3204716.
Wu K, Guo N, Li F, Zhu N, Tao J, Li X. Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2023 May 1;42(5):1618–1622.
Published In
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI
EISSN
1937-4151
ISSN
0278-0070
Publication Date
May 1, 2023
Volume
42
Issue
5
Start / End Page
1618 / 1622
Related Subject Headings
- Computer Hardware & Architecture
- 4607 Graphics, augmented reality and games
- 4009 Electronics, sensors and digital hardware
- 1006 Computer Hardware
- 0906 Electrical and Electronic Engineering