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High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits.

Publication ,  Journal Article
Ballance, CJ; Harty, TP; Linke, NM; Sepiol, MA; Lucas, DM
Published in: Physical review letters
August 2016

We demonstrate laser-driven two-qubit and single-qubit logic gates with respective fidelities 99.9(1)% and 99.9934(3)%, significantly above the ≈99% minimum threshold level required for fault-tolerant quantum computation, using qubits stored in hyperfine ground states of calcium-43 ions held in a room-temperature trap. We study the speed-fidelity trade-off for the two-qubit gate, for gate times between 3.8  μs and 520  μs, and develop a theoretical error model which is consistent with the data and which allows us to identify the principal technical sources of infidelity.

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Published In

Physical review letters

DOI

EISSN

1079-7114

ISSN

0031-9007

Publication Date

August 2016

Volume

117

Issue

6

Start / End Page

060504

Related Subject Headings

  • General Physics
  • 51 Physical sciences
  • 49 Mathematical sciences
  • 40 Engineering
  • 09 Engineering
  • 02 Physical Sciences
  • 01 Mathematical Sciences
 

Citation

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Ballance, C. J., Harty, T. P., Linke, N. M., Sepiol, M. A., & Lucas, D. M. (2016). High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits. Physical Review Letters, 117(6), 060504. https://doi.org/10.1103/physrevlett.117.060504
Ballance, C. J., T. P. Harty, N. M. Linke, M. A. Sepiol, and D. M. Lucas. “High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits.Physical Review Letters 117, no. 6 (August 2016): 060504. https://doi.org/10.1103/physrevlett.117.060504.
Ballance CJ, Harty TP, Linke NM, Sepiol MA, Lucas DM. High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits. Physical review letters. 2016 Aug;117(6):060504.
Ballance, C. J., et al. “High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits.Physical Review Letters, vol. 117, no. 6, Aug. 2016, p. 060504. Epmc, doi:10.1103/physrevlett.117.060504.
Ballance CJ, Harty TP, Linke NM, Sepiol MA, Lucas DM. High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits. Physical review letters. 2016 Aug;117(6):060504.

Published In

Physical review letters

DOI

EISSN

1079-7114

ISSN

0031-9007

Publication Date

August 2016

Volume

117

Issue

6

Start / End Page

060504

Related Subject Headings

  • General Physics
  • 51 Physical sciences
  • 49 Mathematical sciences
  • 40 Engineering
  • 09 Engineering
  • 02 Physical Sciences
  • 01 Mathematical Sciences