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A Graphical Multi-Fidelity Gaussian Process Model, with Application to Emulation of Heavy-Ion Collisions

Publication ,  Journal Article
Ji, Y; Mak, S; Soeder, D; Paquet, JF; Bass, SA
Published in: Technometrics
January 1, 2024

With advances in scientific computing and mathematical modeling, complex scientific phenomena such as galaxy formations and rocket propulsion can now be reliably simulated. Such simulations can however be very time-intensive, requiring millions of CPU hours to perform. One solution is multi-fidelity emulation, which uses data of different fidelities to train an efficient predictive model which emulates the expensive simulator. For complex scientific problems and with careful elicitation from scientists, such multi-fidelity data may often be linked by a directed acyclic graph (DAG) representing its scientific model dependencies. We thus propose a new Graphical Multi-fidelity Gaussian Process (GMGP) model, which embeds this DAG structure (capturing scientific dependencies) within a Gaussian process framework. We show that the GMGP has desirable modeling traits via two Markov properties, and admits a scalable algorithm for recursive computation of the posterior mean and variance along at each depth level of the DAG. We also present a novel experimental design methodology over the DAG given an experimental budget, and propose a nonlinear extension of the GMGP via deep Gaussian processes. The advantages of the GMGP are then demonstrated via a suite of numerical experiments and an application to emulation of heavy-ion collisions, which can be used to study the conditions of matter in the Universe shortly after the Big Bang. The proposed model has broader uses in data fusion applications with graphical structure, which we further discuss.

Duke Scholars

Published In

Technometrics

DOI

EISSN

1537-2723

ISSN

0040-1706

Publication Date

January 1, 2024

Volume

66

Issue

2

Start / End Page

267 / 281

Related Subject Headings

  • Statistics & Probability
  • 4905 Statistics
  • 0104 Statistics
 

Citation

APA
Chicago
ICMJE
MLA
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Ji, Y., Mak, S., Soeder, D., Paquet, J. F., & Bass, S. A. (2024). A Graphical Multi-Fidelity Gaussian Process Model, with Application to Emulation of Heavy-Ion Collisions. Technometrics, 66(2), 267–281. https://doi.org/10.1080/00401706.2023.2281940
Ji, Y., S. Mak, D. Soeder, J. F. Paquet, and S. A. Bass. “A Graphical Multi-Fidelity Gaussian Process Model, with Application to Emulation of Heavy-Ion Collisions.” Technometrics 66, no. 2 (January 1, 2024): 267–81. https://doi.org/10.1080/00401706.2023.2281940.
Ji Y, Mak S, Soeder D, Paquet JF, Bass SA. A Graphical Multi-Fidelity Gaussian Process Model, with Application to Emulation of Heavy-Ion Collisions. Technometrics. 2024 Jan 1;66(2):267–81.
Ji, Y., et al. “A Graphical Multi-Fidelity Gaussian Process Model, with Application to Emulation of Heavy-Ion Collisions.” Technometrics, vol. 66, no. 2, Jan. 2024, pp. 267–81. Scopus, doi:10.1080/00401706.2023.2281940.
Ji Y, Mak S, Soeder D, Paquet JF, Bass SA. A Graphical Multi-Fidelity Gaussian Process Model, with Application to Emulation of Heavy-Ion Collisions. Technometrics. 2024 Jan 1;66(2):267–281.

Published In

Technometrics

DOI

EISSN

1537-2723

ISSN

0040-1706

Publication Date

January 1, 2024

Volume

66

Issue

2

Start / End Page

267 / 281

Related Subject Headings

  • Statistics & Probability
  • 4905 Statistics
  • 0104 Statistics