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From Atomistic to Device Level Investigation of Hybrid Redox Molecular/Silicon Field-Effect Memory Devices

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Buckley, J; Pro, T; Barattin, R; Calborean, A; Huang, K; Aiello, V; Nicotra, G; Gely, M; Delapierre, G; Jalaguier, E; Duclairoir, F; Blaise, P ...
Published in: 2009 IEEE INTERNATIONAL MEMORY WORKSHOP
2009

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Published In

2009 IEEE INTERNATIONAL MEMORY WORKSHOP

ISBN

978-1-4244-3761-0

Publication Date

2009

Start / End Page

17 / +
 

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Buckley, J., Pro, T., Barattin, R., Calborean, A., Huang, K., Aiello, V., … De Salvo, B. (2009). From Atomistic to Device Level Investigation of Hybrid Redox Molecular/Silicon Field-Effect Memory Devices. In 2009 IEEE INTERNATIONAL MEMORY WORKSHOP (pp. 17-+).
Buckley, J., T. Pro, R. Barattin, A. Calborean, K. Huang, V. Aiello, G. Nicotra, et al. “From Atomistic to Device Level Investigation of Hybrid Redox Molecular/Silicon Field-Effect Memory Devices.” In 2009 IEEE INTERNATIONAL MEMORY WORKSHOP, 17-+, 2009.
Buckley J, Pro T, Barattin R, Calborean A, Huang K, Aiello V, et al. From Atomistic to Device Level Investigation of Hybrid Redox Molecular/Silicon Field-Effect Memory Devices. In: 2009 IEEE INTERNATIONAL MEMORY WORKSHOP. 2009. p. 17-+.
Buckley, J., et al. “From Atomistic to Device Level Investigation of Hybrid Redox Molecular/Silicon Field-Effect Memory Devices.” 2009 IEEE INTERNATIONAL MEMORY WORKSHOP, 2009, pp. 17-+.
Buckley J, Pro T, Barattin R, Calborean A, Huang K, Aiello V, Nicotra G, Gely M, Delapierre G, Jalaguier E, Duclairoir F, Chevalier N, Mariolle D, Spinella C, Lombardo S, Blaise P, Maldivi P, Ghibaudo G, Baptist R, De Salvo B. From Atomistic to Device Level Investigation of Hybrid Redox Molecular/Silicon Field-Effect Memory Devices. 2009 IEEE INTERNATIONAL MEMORY WORKSHOP. 2009. p. 17-+.

Published In

2009 IEEE INTERNATIONAL MEMORY WORKSHOP

ISBN

978-1-4244-3761-0

Publication Date

2009

Start / End Page

17 / +