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Root-Cause Analysis with Semi-Supervised Co-Training for Integrated Systems

Publication ,  Journal Article
Pan, R; Li, X; Chakrabarty, K
Published in: ACM Transactions on Design Automation of Electronic Systems
May 3, 2024

Root-cause analysis for integrated systems has become increasingly challenging due to their growing complexity. To tackle these challenges, machine learning (ML) has been applied to enhance root-cause analysis. Nonetheless, ML-based root-cause analysis usually requires abundant training data with root causes labeled by human experts, which are difficult or even impossible to obtain. To overcome this drawback, a semi-supervised co-training method is proposed for root-cause analysis in this article, which only requires a small portion of labeled data. First, a random forest is trained with labeled data. Next, we propose a co-training technique to learn from unlabeled data with semi-supervised learning, which pre-labels a subset of these data automatically and then retrains each decision tree in the random forest. In addition, a robust framework is proposed to avoid over-fitting. We further apply initialization by clustering and feature selection to improve the diagnostic performance. With two case studies from industry, the proposed approach shows superior performance against other state-of-the-art methods by saving up to 67% of labeling efforts.

Duke Scholars

Published In

ACM Transactions on Design Automation of Electronic Systems

DOI

EISSN

1557-7309

ISSN

1084-4309

Publication Date

May 3, 2024

Volume

29

Issue

3

Related Subject Headings

  • Design Practice & Management
  • 4612 Software engineering
  • 4606 Distributed computing and systems software
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0803 Computer Software
 

Citation

APA
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ICMJE
MLA
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Pan, R., Li, X., & Chakrabarty, K. (2024). Root-Cause Analysis with Semi-Supervised Co-Training for Integrated Systems. ACM Transactions on Design Automation of Electronic Systems, 29(3). https://doi.org/10.1145/3649313
Pan, R., X. Li, and K. Chakrabarty. “Root-Cause Analysis with Semi-Supervised Co-Training for Integrated Systems.” ACM Transactions on Design Automation of Electronic Systems 29, no. 3 (May 3, 2024). https://doi.org/10.1145/3649313.
Pan R, Li X, Chakrabarty K. Root-Cause Analysis with Semi-Supervised Co-Training for Integrated Systems. ACM Transactions on Design Automation of Electronic Systems. 2024 May 3;29(3).
Pan, R., et al. “Root-Cause Analysis with Semi-Supervised Co-Training for Integrated Systems.” ACM Transactions on Design Automation of Electronic Systems, vol. 29, no. 3, May 2024. Scopus, doi:10.1145/3649313.
Pan R, Li X, Chakrabarty K. Root-Cause Analysis with Semi-Supervised Co-Training for Integrated Systems. ACM Transactions on Design Automation of Electronic Systems. 2024 May 3;29(3).

Published In

ACM Transactions on Design Automation of Electronic Systems

DOI

EISSN

1557-7309

ISSN

1084-4309

Publication Date

May 3, 2024

Volume

29

Issue

3

Related Subject Headings

  • Design Practice & Management
  • 4612 Software engineering
  • 4606 Distributed computing and systems software
  • 4009 Electronics, sensors and digital hardware
  • 1006 Computer Hardware
  • 0803 Computer Software