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Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”

Publication ,  Journal Article
Li, H; Mehra, R
Published in: IEEE Design & Test
December 2025
Published version (DOI) Publisher Link

Duke Scholars

Hai "Helen" Li
Author Hai "Helen" Li Electrical and Computer Engineering

Published In

IEEE Design & Test

DOI

10.1109/mdat.2025.3605046

EISSN

2168-2364

ISSN

2168-2356

Publication Date

December 2025

Volume

42

Issue

6

Start / End Page

138 / 139

Publisher

Institute of Electrical and Electronics Engineers (IEEE)
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Li, H., & Mehra, R. (2025). Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”. IEEE Design & Test, 42(6), 138–139. https://doi.org/10.1109/mdat.2025.3605046
Li, Hai, and Ranu Mehra. “Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”.” IEEE Design & Test 42, no. 6 (December 2025): 138–39. https://doi.org/10.1109/mdat.2025.3605046.
Li, Hai, and Ranu Mehra. “Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”.” IEEE Design & Test, vol. 42, no. 6, Institute of Electrical and Electronics Engineers (IEEE), Dec. 2025, pp. 138–39. Crossref, doi:10.1109/mdat.2025.3605046.
Li H, Mehra R. Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”. IEEE Design & Test. Institute of Electrical and Electronics Engineers (IEEE); 2025 Dec;42(6):138–139.

Published In

IEEE Design & Test

DOI

10.1109/mdat.2025.3605046

EISSN

2168-2364

ISSN

2168-2356

Publication Date

December 2025

Volume

42

Issue

6

Start / End Page

138 / 139

Publisher

Institute of Electrical and Electronics Engineers (IEEE)