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Direct emission of molecular fragments during the sputtering of poly(4-hydroxystyrene) and determination of ion structures using tandem secondary ion mass spectrometry

Publication ,  Journal Article
Leggett, GJ; Chilkoti, A; Castner, DG; Ratner, BD; Vickerman, JC
Published in: International Journal of Mass Spectrometry and Ion Processes
September 2, 1991

Poly(4-hydroxystyrene) (P4HS) has been studied using a tandem secondary ion mass spectrometer under static conditions. The secondary ion mass spectrometry (SIMS) spectrum of P4HS exhibits few ions which are not observed in the SIMS spectrum of polystyrene. The fragmentation of these oxygen-containing ions has been investigated in detail and the relevant neutral losses have been deduced. These ions are found to have structures based upon either the tropyllium ion or the styrene ion. The absence of other oxygen-containing ions is explained in terms of the ready loss of oxygen-containing neutral fragments from P4HS compared with the loss of hydrocarbon fragments. The oxygen-containing tropyllium and styrene ions are, in contrast, readily formed, and in these cases the energy barrier to formation of the oxygen-containing ion is less than the energy barrier to expulsion of oxygen-containing neutral species. © 1991.

Duke Scholars

Published In

International Journal of Mass Spectrometry and Ion Processes

DOI

ISSN

0168-1176

Publication Date

September 2, 1991

Volume

108

Issue

1

Start / End Page

29 / 39

Related Subject Headings

  • Analytical Chemistry
 

Citation

APA
Chicago
ICMJE
MLA
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Leggett, G. J., Chilkoti, A., Castner, D. G., Ratner, B. D., & Vickerman, J. C. (1991). Direct emission of molecular fragments during the sputtering of poly(4-hydroxystyrene) and determination of ion structures using tandem secondary ion mass spectrometry. International Journal of Mass Spectrometry and Ion Processes, 108(1), 29–39. https://doi.org/10.1016/0168-1176(91)87004-K
Leggett, G. J., A. Chilkoti, D. G. Castner, B. D. Ratner, and J. C. Vickerman. “Direct emission of molecular fragments during the sputtering of poly(4-hydroxystyrene) and determination of ion structures using tandem secondary ion mass spectrometry.” International Journal of Mass Spectrometry and Ion Processes 108, no. 1 (September 2, 1991): 29–39. https://doi.org/10.1016/0168-1176(91)87004-K.
Leggett GJ, Chilkoti A, Castner DG, Ratner BD, Vickerman JC. Direct emission of molecular fragments during the sputtering of poly(4-hydroxystyrene) and determination of ion structures using tandem secondary ion mass spectrometry. International Journal of Mass Spectrometry and Ion Processes. 1991 Sep 2;108(1):29–39.
Leggett, G. J., et al. “Direct emission of molecular fragments during the sputtering of poly(4-hydroxystyrene) and determination of ion structures using tandem secondary ion mass spectrometry.” International Journal of Mass Spectrometry and Ion Processes, vol. 108, no. 1, Sept. 1991, pp. 29–39. Scopus, doi:10.1016/0168-1176(91)87004-K.
Leggett GJ, Chilkoti A, Castner DG, Ratner BD, Vickerman JC. Direct emission of molecular fragments during the sputtering of poly(4-hydroxystyrene) and determination of ion structures using tandem secondary ion mass spectrometry. International Journal of Mass Spectrometry and Ion Processes. 1991 Sep 2;108(1):29–39.

Published In

International Journal of Mass Spectrometry and Ion Processes

DOI

ISSN

0168-1176

Publication Date

September 2, 1991

Volume

108

Issue

1

Start / End Page

29 / 39

Related Subject Headings

  • Analytical Chemistry