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Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted Polystyrene

Publication ,  Journal Article
Chilkoti, A; Castner, DG; Ratner, BD
Published in: Applied Spectroscopy
February 1991

Denteration in polystyrene (PS) and the differences between PS, poly(4-methyl styrene) (P4MS), and poly( α-methyl styrene) (PAMS) were examined with static secondary ion mass spectrometry (SIMS) and x-ray photoelectron spectroscopy (XPS). Only the effects of methyl substitution could be distinguished by XPS on the basis of the valence band spectra. However, it was demonstrated that both deuterium and methyl substitution effects could be clearly distinguished by static SIMS. Additionally, the effect of these substitutions could be explained in a manner analogous to that used for electron impact (EI) mass spectrometry. By the use of deuterium-labeled polymers, H scrambling was observed during secondary ion formation from PS. The validity of previously postulated secondary ion structures was confirmed on the basis of the fragmentation patterns of both the deuterium and methyl-substituted PS.

Duke Scholars

Published In

Applied Spectroscopy

DOI

EISSN

1943-3530

ISSN

0003-7028

Publication Date

February 1991

Volume

45

Issue

2

Start / End Page

209 / 217

Publisher

SAGE Publications

Related Subject Headings

  • Analytical Chemistry
  • 0913 Mechanical Engineering
  • 0306 Physical Chemistry (incl. Structural)
  • 0301 Analytical Chemistry
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Chilkoti, A., Castner, D. G., & Ratner, B. D. (1991). Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted Polystyrene. Applied Spectroscopy, 45(2), 209–217. https://doi.org/10.1366/0003702914337588
Chilkoti, Ashutosh, David G. Castner, and Buddy D. Ratner. “Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted Polystyrene.” Applied Spectroscopy 45, no. 2 (February 1991): 209–17. https://doi.org/10.1366/0003702914337588.
Chilkoti A, Castner DG, Ratner BD. Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted Polystyrene. Applied Spectroscopy. 1991 Feb;45(2):209–17.
Chilkoti, Ashutosh, et al. “Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted Polystyrene.” Applied Spectroscopy, vol. 45, no. 2, SAGE Publications, Feb. 1991, pp. 209–17. Crossref, doi:10.1366/0003702914337588.
Chilkoti A, Castner DG, Ratner BD. Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted Polystyrene. Applied Spectroscopy. SAGE Publications; 1991 Feb;45(2):209–217.
Journal cover image

Published In

Applied Spectroscopy

DOI

EISSN

1943-3530

ISSN

0003-7028

Publication Date

February 1991

Volume

45

Issue

2

Start / End Page

209 / 217

Publisher

SAGE Publications

Related Subject Headings

  • Analytical Chemistry
  • 0913 Mechanical Engineering
  • 0306 Physical Chemistry (incl. Structural)
  • 0301 Analytical Chemistry