ZENER AND AVALANCHE BREAKDOWN IN As-IMPLANTED LOW-VOLTAGE Si n-p JUNCTIONS.
Publication
, Journal Article
Fair, RB; Wivell, HW
Published in: IEEE Transactions on Electron Devices
1976
Following a verification of the calculated I-V curves and their temperature dependence as a function of grade constant, calculated curves are presented which correlate As implant dose and diffusion with junction breakdown voltage, breakdown impedance, and temperature coefficient of reverse voltage. The temperature coefficient is shown to change from negative to positive as the transition from tunneling to avalanche occurs. In addition, the relative importance of tunneling and multiplied-generation current as a function of current density is elucidated for any particular As layer grade constant.
Duke Scholars
Published In
IEEE Transactions on Electron Devices
Publication Date
1976
Volume
ED-23
Issue
5
Start / End Page
512 / 518
Related Subject Headings
- Applied Physics
- 0906 Electrical and Electronic Engineering
Citation
APA
Chicago
ICMJE
MLA
NLM
Fair, R. B., & Wivell, H. W. (1976). ZENER AND AVALANCHE BREAKDOWN IN As-IMPLANTED LOW-VOLTAGE Si n-p JUNCTIONS. IEEE Transactions on Electron Devices, ED-23(5), 512–518.
Fair, R. B., and H. W. Wivell. “ZENER AND AVALANCHE BREAKDOWN IN As-IMPLANTED LOW-VOLTAGE Si n-p JUNCTIONS.” IEEE Transactions on Electron Devices ED-23, no. 5 (1976): 512–18.
Fair RB, Wivell HW. ZENER AND AVALANCHE BREAKDOWN IN As-IMPLANTED LOW-VOLTAGE Si n-p JUNCTIONS. IEEE Transactions on Electron Devices. 1976;ED-23(5):512–8.
Fair, R. B., and H. W. Wivell. “ZENER AND AVALANCHE BREAKDOWN IN As-IMPLANTED LOW-VOLTAGE Si n-p JUNCTIONS.” IEEE Transactions on Electron Devices, vol. ED-23, no. 5, 1976, pp. 512–18.
Fair RB, Wivell HW. ZENER AND AVALANCHE BREAKDOWN IN As-IMPLANTED LOW-VOLTAGE Si n-p JUNCTIONS. IEEE Transactions on Electron Devices. 1976;ED-23(5):512–518.
Published In
IEEE Transactions on Electron Devices
Publication Date
1976
Volume
ED-23
Issue
5
Start / End Page
512 / 518
Related Subject Headings
- Applied Physics
- 0906 Electrical and Electronic Engineering