Skip to main content
Journal cover image

Nanoscale detection of ionizing radiation damage to DNA by atomic force microscopy.

Publication ,  Journal Article
Ke, C; Jiang, Y; Mieczkowski, PA; Muramoto, GG; Chute, JP; Marszalek, PE
Published in: Small (Weinheim an der Bergstrasse, Germany)
February 2008

The detection and quantification of ionizing radiation damage to DNA at a single-molecule level by atomic force microscopy (AFM) is reported. The DNA damage-detection technique combining supercoiled plasmid relaxation assay with AFM imaging is a direct and quantitative approach to detect gamma-ray-induced single- and double-strand breaks in DNA, and its accuracy and reliability are validated through a comparison with traditional agarose gel electrophoresis. In addition, the dependence of radiation-induced single-strand breaks on plasmid size and concentration at a single-molecule level in a low-dose (1 Gy) and low-concentration range (0.01 ng microL(-1)-10 ng microL(-1)) is investigated using the AFM-based damage-detection assay. The results clearly show that the number of single-strand breaks per DNA molecule is linearly proportional to the plasmid size and inversely correlated to the DNA concentration. This assay can also efficiently detect DNA damage in highly dilute samples (0.01 ng microL(-1)), which is beyond the capability of traditional techniques. AFM imaging can uniquely supplement traditional techniques for sensitive measurements of damage to DNA by ionizing radiation.

Duke Scholars

Published In

Small (Weinheim an der Bergstrasse, Germany)

DOI

EISSN

1613-6829

ISSN

1613-6810

Publication Date

February 2008

Volume

4

Issue

2

Start / End Page

288 / 294

Related Subject Headings

  • Plasmids
  • Nanotechnology
  • Nanoscience & Nanotechnology
  • Microscopy, Atomic Force
  • Gamma Rays
  • Electrophoresis, Agar Gel
  • Dose-Response Relationship, Radiation
  • DNA, Superhelical
  • DNA Damage
  • DNA Breaks, Single-Stranded
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Ke, C., Jiang, Y., Mieczkowski, P. A., Muramoto, G. G., Chute, J. P., & Marszalek, P. E. (2008). Nanoscale detection of ionizing radiation damage to DNA by atomic force microscopy. Small (Weinheim an Der Bergstrasse, Germany), 4(2), 288–294. https://doi.org/10.1002/smll.200700527
Ke, Changhong, Yong Jiang, Piotr A. Mieczkowski, Garrett G. Muramoto, John P. Chute, and Piotr E. Marszalek. “Nanoscale detection of ionizing radiation damage to DNA by atomic force microscopy.Small (Weinheim an Der Bergstrasse, Germany) 4, no. 2 (February 2008): 288–94. https://doi.org/10.1002/smll.200700527.
Ke C, Jiang Y, Mieczkowski PA, Muramoto GG, Chute JP, Marszalek PE. Nanoscale detection of ionizing radiation damage to DNA by atomic force microscopy. Small (Weinheim an der Bergstrasse, Germany). 2008 Feb;4(2):288–94.
Ke, Changhong, et al. “Nanoscale detection of ionizing radiation damage to DNA by atomic force microscopy.Small (Weinheim an Der Bergstrasse, Germany), vol. 4, no. 2, Feb. 2008, pp. 288–94. Epmc, doi:10.1002/smll.200700527.
Ke C, Jiang Y, Mieczkowski PA, Muramoto GG, Chute JP, Marszalek PE. Nanoscale detection of ionizing radiation damage to DNA by atomic force microscopy. Small (Weinheim an der Bergstrasse, Germany). 2008 Feb;4(2):288–294.
Journal cover image

Published In

Small (Weinheim an der Bergstrasse, Germany)

DOI

EISSN

1613-6829

ISSN

1613-6810

Publication Date

February 2008

Volume

4

Issue

2

Start / End Page

288 / 294

Related Subject Headings

  • Plasmids
  • Nanotechnology
  • Nanoscience & Nanotechnology
  • Microscopy, Atomic Force
  • Gamma Rays
  • Electrophoresis, Agar Gel
  • Dose-Response Relationship, Radiation
  • DNA, Superhelical
  • DNA Damage
  • DNA Breaks, Single-Stranded