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Estimation of computed tomography dose index in cone beam computed tomography: MOSFET measurements and Monte Carlo simulations.

Publication ,  Journal Article
Kim, S; Yoshizumi, T; Toncheva, G; Yoo, S; Yin, F-F; Frush, D
Published in: Health Phys
May 2010

To address the lack of accurate dose estimation method in cone beam computed tomography (CBCT), we performed point dose metal oxide semiconductor field-effect transistor (MOSFET) measurements and Monte Carlo (MC) simulations. A Varian On-Board Imager (OBI) was employed to measure point doses in the polymethyl methacrylate (PMMA) CT phantoms with MOSFETs for standard and low dose modes. A MC model of the OBI x-ray tube was developed using BEAMnrc/EGSnrc MC system and validated by the half value layer, x-ray spectrum and lateral and depth dose profiles. We compared the weighted computed tomography dose index (CTDIw) between MOSFET measurements and MC simulations. The CTDIw was found to be 8.39 cGy for the head scan and 4.58 cGy for the body scan from the MOSFET measurements in standard dose mode, and 1.89 cGy for the head and 1.11 cGy for the body in low dose mode, respectively. The CTDIw from MC compared well to the MOSFET measurements within 5% differences. In conclusion, a MC model for Varian CBCT has been established and this approach may be easily extended from the CBCT geometry to multi-detector CT geometry.

Duke Scholars

Published In

Health Phys

DOI

EISSN

1538-5159

Publication Date

May 2010

Volume

98

Issue

5

Start / End Page

683 / 691

Location

United States

Related Subject Headings

  • Transistors, Electronic
  • Sensitivity and Specificity
  • Reproducibility of Results
  • Radiometry
  • Radiation Dosage
  • Nuclear Medicine & Medical Imaging
  • Monte Carlo Method
  • Models, Statistical
  • Models, Biological
  • Humans
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Kim, S., Yoshizumi, T., Toncheva, G., Yoo, S., Yin, F.-F., & Frush, D. (2010). Estimation of computed tomography dose index in cone beam computed tomography: MOSFET measurements and Monte Carlo simulations. Health Phys, 98(5), 683–691. https://doi.org/10.1097/HP.0b013e3181cd3ec3
Kim, Sangroh, Terry Yoshizumi, Greta Toncheva, Sua Yoo, Fang-Fang Yin, and Donald Frush. “Estimation of computed tomography dose index in cone beam computed tomography: MOSFET measurements and Monte Carlo simulations.Health Phys 98, no. 5 (May 2010): 683–91. https://doi.org/10.1097/HP.0b013e3181cd3ec3.
Kim S, Yoshizumi T, Toncheva G, Yoo S, Yin F-F, Frush D. Estimation of computed tomography dose index in cone beam computed tomography: MOSFET measurements and Monte Carlo simulations. Health Phys. 2010 May;98(5):683–91.
Kim, Sangroh, et al. “Estimation of computed tomography dose index in cone beam computed tomography: MOSFET measurements and Monte Carlo simulations.Health Phys, vol. 98, no. 5, May 2010, pp. 683–91. Pubmed, doi:10.1097/HP.0b013e3181cd3ec3.
Kim S, Yoshizumi T, Toncheva G, Yoo S, Yin F-F, Frush D. Estimation of computed tomography dose index in cone beam computed tomography: MOSFET measurements and Monte Carlo simulations. Health Phys. 2010 May;98(5):683–691.

Published In

Health Phys

DOI

EISSN

1538-5159

Publication Date

May 2010

Volume

98

Issue

5

Start / End Page

683 / 691

Location

United States

Related Subject Headings

  • Transistors, Electronic
  • Sensitivity and Specificity
  • Reproducibility of Results
  • Radiometry
  • Radiation Dosage
  • Nuclear Medicine & Medical Imaging
  • Monte Carlo Method
  • Models, Statistical
  • Models, Biological
  • Humans