Static secondary ion mass spectrometric investigation of the surface chemistry of organic plasma-deposited films created from oxygen-containing precursors. 3. Multivariate statistical modeling.
Publication
, Journal Article
Chilkoti, A; Ratner, BD; Briggs, D
Published in: Analytical chemistry
July 1993
Partial least squares (PLS) multivariate statistical models were developed to predict the surface composition and chemistry of a set of model homopolymers based on their static SIMS fragmentation patterns. In the calibration or model-building step, the positive and negative ion static SIMS spectra of different classes of model homopolymers were related to specific chemical attributes of the polymers. The models were then used to examine the surface chemistry of oxygen-containing plasma-deposited films prepared from a variety of precursors. PLS models were developed to predict the surface oxygen concentration and H/C ratios. The results obtained from the PLS models were compared with experimental results.
Duke Scholars
Published In
Analytical chemistry
DOI
EISSN
1520-6882
ISSN
0003-2700
Publication Date
July 1993
Volume
65
Issue
13
Start / End Page
1736 / 1745
Related Subject Headings
- Polymers
- Oxygen
- Mass Spectrometry
- Calibration
- Analytical Chemistry
- Analysis of Variance
- 4004 Chemical engineering
- 3401 Analytical chemistry
- 3205 Medical biochemistry and metabolomics
- 0399 Other Chemical Sciences
Citation
APA
Chicago
ICMJE
MLA
NLM
Chilkoti, A., Ratner, B. D., & Briggs, D. (1993). Static secondary ion mass spectrometric investigation of the surface chemistry of organic plasma-deposited films created from oxygen-containing precursors. 3. Multivariate statistical modeling. Analytical Chemistry, 65(13), 1736–1745. https://doi.org/10.1021/ac00061a017
Chilkoti, A., B. D. Ratner, and D. Briggs. “Static secondary ion mass spectrometric investigation of the surface chemistry of organic plasma-deposited films created from oxygen-containing precursors. 3. Multivariate statistical modeling.” Analytical Chemistry 65, no. 13 (July 1993): 1736–45. https://doi.org/10.1021/ac00061a017.
Chilkoti A, Ratner BD, Briggs D. Static secondary ion mass spectrometric investigation of the surface chemistry of organic plasma-deposited films created from oxygen-containing precursors. 3. Multivariate statistical modeling. Analytical chemistry. 1993 Jul;65(13):1736–45.
Chilkoti, A., et al. “Static secondary ion mass spectrometric investigation of the surface chemistry of organic plasma-deposited films created from oxygen-containing precursors. 3. Multivariate statistical modeling.” Analytical Chemistry, vol. 65, no. 13, July 1993, pp. 1736–45. Epmc, doi:10.1021/ac00061a017.
Chilkoti A, Ratner BD, Briggs D. Static secondary ion mass spectrometric investigation of the surface chemistry of organic plasma-deposited films created from oxygen-containing precursors. 3. Multivariate statistical modeling. Analytical chemistry. 1993 Jul;65(13):1736–1745.
Published In
Analytical chemistry
DOI
EISSN
1520-6882
ISSN
0003-2700
Publication Date
July 1993
Volume
65
Issue
13
Start / End Page
1736 / 1745
Related Subject Headings
- Polymers
- Oxygen
- Mass Spectrometry
- Calibration
- Analytical Chemistry
- Analysis of Variance
- 4004 Chemical engineering
- 3401 Analytical chemistry
- 3205 Medical biochemistry and metabolomics
- 0399 Other Chemical Sciences