Determining thickness independently from optical constants using ultrafast spectral interferometry
Publication
, Journal Article
Huang, F; Federici, JF; Gary, D; Jedju, T; Warren, WS
Published in: Optics InfoBase Conference Papers
January 1, 2005
We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer. © 2005 Optical Society of America.
Duke Scholars
Published In
Optics InfoBase Conference Papers
EISSN
2162-2701
Publication Date
January 1, 2005
Citation
APA
Chicago
ICMJE
MLA
NLM
Huang, F., Federici, J. F., Gary, D., Jedju, T., & Warren, W. S. (2005). Determining thickness independently from optical constants using ultrafast spectral interferometry. Optics InfoBase Conference Papers.
Huang, F., J. F. Federici, D. Gary, T. Jedju, and W. S. Warren. “Determining thickness independently from optical constants using ultrafast spectral interferometry.” Optics InfoBase Conference Papers, January 1, 2005.
Huang F, Federici JF, Gary D, Jedju T, Warren WS. Determining thickness independently from optical constants using ultrafast spectral interferometry. Optics InfoBase Conference Papers. 2005 Jan 1;
Huang, F., et al. “Determining thickness independently from optical constants using ultrafast spectral interferometry.” Optics InfoBase Conference Papers, Jan. 2005.
Huang F, Federici JF, Gary D, Jedju T, Warren WS. Determining thickness independently from optical constants using ultrafast spectral interferometry. Optics InfoBase Conference Papers. 2005 Jan 1;
Published In
Optics InfoBase Conference Papers
EISSN
2162-2701
Publication Date
January 1, 2005