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Determining thickness independently from optical constants using ultrafast spectral interferometry

Publication ,  Journal Article
Huang, F; Federici, JF; Gary, D; Jedju, T; Warren, WS
Published in: Optics InfoBase Conference Papers
January 1, 2005

We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer. © 2005 Optical Society of America.

Duke Scholars

Published In

Optics InfoBase Conference Papers

EISSN

2162-2701

Publication Date

January 1, 2005
 

Citation

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Huang, F., Federici, J. F., Gary, D., Jedju, T., & Warren, W. S. (2005). Determining thickness independently from optical constants using ultrafast spectral interferometry. Optics InfoBase Conference Papers.
Huang, F., J. F. Federici, D. Gary, T. Jedju, and W. S. Warren. “Determining thickness independently from optical constants using ultrafast spectral interferometry.” Optics InfoBase Conference Papers, January 1, 2005.
Huang F, Federici JF, Gary D, Jedju T, Warren WS. Determining thickness independently from optical constants using ultrafast spectral interferometry. Optics InfoBase Conference Papers. 2005 Jan 1;
Huang, F., et al. “Determining thickness independently from optical constants using ultrafast spectral interferometry.” Optics InfoBase Conference Papers, Jan. 2005.
Huang F, Federici JF, Gary D, Jedju T, Warren WS. Determining thickness independently from optical constants using ultrafast spectral interferometry. Optics InfoBase Conference Papers. 2005 Jan 1;

Published In

Optics InfoBase Conference Papers

EISSN

2162-2701

Publication Date

January 1, 2005