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Measuring morphological features using light-scattering spectroscopy and Fourier-domain low-coherence interferometry.

Publication ,  Journal Article
Robles, FE; Wax, A
Published in: Optics letters
February 2010

We present measurements of morphological features in a thick turbid sample using light-scattering spectroscopy (LSS) and Fourier-domain low-coherence interferometry (fLCI) by processing with the dual-window (DW) method. A parallel frequency domain optical coherence tomography (OCT) system with a white-light source is used to image a two-layer phantom containing polystyrene beads of diameters 4.00 and 6.98 mum on the top and bottom layers, respectively. The DW method decomposes each OCT A-scan into a time-frequency distribution with simultaneously high spectral and spatial resolution. The spectral information from localized regions in the sample is used to determine scatterer structure. The results show that the two scatterer populations can be differentiated using LSS and fLCI.

Duke Scholars

Published In

Optics letters

DOI

EISSN

1539-4794

ISSN

0146-9592

Publication Date

February 2010

Volume

35

Issue

3

Start / End Page

360 / 362

Related Subject Headings

  • Water
  • Surface Plasmon Resonance
  • Spectrophotometry
  • Scattering, Radiation
  • Optics
  • Nanotechnology
  • Nanoparticles
  • Models, Statistical
  • Light
  • Interferometry
 

Citation

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ICMJE
MLA
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Robles, F. E., & Wax, A. (2010). Measuring morphological features using light-scattering spectroscopy and Fourier-domain low-coherence interferometry. Optics Letters, 35(3), 360–362. https://doi.org/10.1364/ol.35.000360
Robles, Francisco E., and Adam Wax. “Measuring morphological features using light-scattering spectroscopy and Fourier-domain low-coherence interferometry.Optics Letters 35, no. 3 (February 2010): 360–62. https://doi.org/10.1364/ol.35.000360.
Robles, Francisco E., and Adam Wax. “Measuring morphological features using light-scattering spectroscopy and Fourier-domain low-coherence interferometry.Optics Letters, vol. 35, no. 3, Feb. 2010, pp. 360–62. Epmc, doi:10.1364/ol.35.000360.
Journal cover image

Published In

Optics letters

DOI

EISSN

1539-4794

ISSN

0146-9592

Publication Date

February 2010

Volume

35

Issue

3

Start / End Page

360 / 362

Related Subject Headings

  • Water
  • Surface Plasmon Resonance
  • Spectrophotometry
  • Scattering, Radiation
  • Optics
  • Nanotechnology
  • Nanoparticles
  • Models, Statistical
  • Light
  • Interferometry