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Measurement system for the high-throughput characterization of metal nanoparticles for biosensors

Publication ,  Journal Article
Curry, A; Nusz, G; Chilkoti, A; Wax, A
Published in: Optics InfoBase Conference Papers
January 1, 2006

We present a system for the rapid characterization of nanoparticles for biosensors, providing concurrent atomic force microscopy and scattering spectra of individual nanoparticles and simultaneous spectra from various nanostructures created by electron beam lithography © 2005 Optical Society of America.

Duke Scholars

Published In

Optics InfoBase Conference Papers

EISSN

2162-2701

Publication Date

January 1, 2006
 

Citation

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Curry, A., Nusz, G., Chilkoti, A., & Wax, A. (2006). Measurement system for the high-throughput characterization of metal nanoparticles for biosensors. Optics InfoBase Conference Papers.
Curry, A., G. Nusz, A. Chilkoti, and A. Wax. “Measurement system for the high-throughput characterization of metal nanoparticles for biosensors.” Optics InfoBase Conference Papers, January 1, 2006.
Curry A, Nusz G, Chilkoti A, Wax A. Measurement system for the high-throughput characterization of metal nanoparticles for biosensors. Optics InfoBase Conference Papers. 2006 Jan 1;
Curry, A., et al. “Measurement system for the high-throughput characterization of metal nanoparticles for biosensors.” Optics InfoBase Conference Papers, Jan. 2006.
Curry A, Nusz G, Chilkoti A, Wax A. Measurement system for the high-throughput characterization of metal nanoparticles for biosensors. Optics InfoBase Conference Papers. 2006 Jan 1;

Published In

Optics InfoBase Conference Papers

EISSN

2162-2701

Publication Date

January 1, 2006