Measurement system for the high-throughput characterization of metal nanoparticles for biosensors
Publication
, Journal Article
Curry, A; Nusz, G; Chilkoti, A; Wax, A
Published in: Optics InfoBase Conference Papers
January 1, 2005
We present a system for the rapid characterization of nanoparticles for biosensors, providing concurrent atomic force microscopy and scattering spectra of individual nanoparticles and simultaneous spectra from various nanostructures created by electron beam lithography © 2005 Optical Society of America.
Duke Scholars
Published In
Optics InfoBase Conference Papers
EISSN
2162-2701
Publication Date
January 1, 2005
Citation
APA
Chicago
ICMJE
MLA
NLM
Curry, A., Nusz, G., Chilkoti, A., & Wax, A. (2005). Measurement system for the high-throughput characterization of metal nanoparticles for biosensors. Optics InfoBase Conference Papers.
Curry, A., G. Nusz, A. Chilkoti, and A. Wax. “Measurement system for the high-throughput characterization of metal nanoparticles for biosensors.” Optics InfoBase Conference Papers, January 1, 2005.
Curry A, Nusz G, Chilkoti A, Wax A. Measurement system for the high-throughput characterization of metal nanoparticles for biosensors. Optics InfoBase Conference Papers. 2005 Jan 1;
Curry, A., et al. “Measurement system for the high-throughput characterization of metal nanoparticles for biosensors.” Optics InfoBase Conference Papers, Jan. 2005.
Curry A, Nusz G, Chilkoti A, Wax A. Measurement system for the high-throughput characterization of metal nanoparticles for biosensors. Optics InfoBase Conference Papers. 2005 Jan 1;
Published In
Optics InfoBase Conference Papers
EISSN
2162-2701
Publication Date
January 1, 2005