Scholars@Duke publication: High-resolution scanning hall probe microscopy

High-resolution scanning hall probe microscopy

Publication , Conference

Hallen, HD; Hess, HF; Chang, AM; Pfeiffer, LN; West, KW; Mitzi, DB

Published in: Proceedings of SPIE the International Society for Optical Engineering

June 4, 1993

A high resolution scanning Hall probe microscope is used to spatially resolve vortices in high temperature superconducting Bi2Sr2CaCu2O8+δ crystals. We observe a partially ordered vortex lattice at several different applied magnetic fields and temperatures. At higher temperatures, a limited amount of vortex re-arrangement is observed, but most vortices remain fixed for periods long compared to the imaging time of several hours even at temperatures as high as 75°K (the superconducting transition temperature for these crystals is ∼84°K). A measure of the local magnetic penetration depth can be obtained from a fit to the surface field of several neighboring vortices, and has been measured as a function of temperature. In particular, we have measured the zero temperature penetration depth and found it to be 275 ± 40 nm.

Duke Scholars

Author Albert M. Chang Physics

Author David Mitzi Thomas Lord Department of Mechanical Engineering and Materia ...

Published In

Proceedings of SPIE the International Society for Optical Engineering

DOI

10.1117/12.146371

EISSN

1996-756X

ISSN

0277-786X

Publication Date

June 4, 1993

Volume

1855

Start / End Page

152 / 157

Related Subject Headings

5102 Atomic, molecular and optical physics
4009 Electronics, sensors and digital hardware
4006 Communications engineering

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MLA

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Hallen, H. D., Hess, H. F., Chang, A. M., Pfeiffer, L. N., West, K. W., & Mitzi, D. B. (1993). High-resolution scanning hall probe microscopy. In Proceedings of SPIE the International Society for Optical Engineering (Vol. 1855, pp. 152–157). https://doi.org/10.1117/12.146371

Hallen, H. D., H. F. Hess, A. M. Chang, L. N. Pfeiffer, K. W. West, and D. B. Mitzi. “High-resolution scanning hall probe microscopy.” In Proceedings of SPIE the International Society for Optical Engineering, 1855:152–57, 1993. https://doi.org/10.1117/12.146371.

Hallen HD, Hess HF, Chang AM, Pfeiffer LN, West KW, Mitzi DB. High-resolution scanning hall probe microscopy. In: Proceedings of SPIE the International Society for Optical Engineering. 1993. p. 152–7.

Hallen, H. D., et al. “High-resolution scanning hall probe microscopy.” Proceedings of SPIE the International Society for Optical Engineering, vol. 1855, 1993, pp. 152–57. Scopus, doi:10.1117/12.146371.

Hallen HD, Hess HF, Chang AM, Pfeiffer LN, West KW, Mitzi DB. High-resolution scanning hall probe microscopy. Proceedings of SPIE the International Society for Optical Engineering. 1993. p. 152–157.

Published In

Proceedings of SPIE the International Society for Optical Engineering

DOI

10.1117/12.146371

EISSN

1996-756X

ISSN

0277-786X

Publication Date

June 4, 1993

Volume

1855

Start / End Page

152 / 157

Related Subject Headings

5102 Atomic, molecular and optical physics
4009 Electronics, sensors and digital hardware
4006 Communications engineering