Scholars@Duke

High-resolution scanning hall probe microscopy

Publication ,  Conference
Hallen, HD; Hess, HF; Chang, AM; Pfeiffer, LN; West, KW; Mitzi, DB
Published in: Proceedings of SPIE - The International Society for Optical Engineering
June 4, 1993
Published version (DOI)

A high resolution scanning Hall probe microscope is used to spatially resolve vortices in high temperature superconducting Bi2Sr2CaCu2O8+δ crystals. We observe a partially ordered vortex lattice at several different applied magnetic fields and temperatures. At higher temperatures, a limited amount of vortex re-arrangement is observed, but most vortices remain fixed for periods long compared to the imaging time of several hours even at temperatures as high as 75°K (the superconducting transition temperature for these crystals is ∼84°K). A measure of the local magnetic penetration depth can be obtained from a fit to the surface field of several neighboring vortices, and has been measured as a function of temperature. In particular, we have measured the zero temperature penetration depth and found it to be 275 ± 40 nm.

Duke Scholars

Albert M. Chang
Author Albert M. Chang Physics
David Mitzi
Author David Mitzi Thomas Lord Department of Mechanical Engineering and Materia ...

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

10.1117/12.146371

EISSN

1996-756X

ISSN

0277-786X

Publication Date

June 4, 1993

Volume

1855

Start / End Page

152 / 157

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering
 

Citation

APA
Chicago
ICMJE
MLA
NLM
Hallen, H. D., Hess, H. F., Chang, A. M., Pfeiffer, L. N., West, K. W., & Mitzi, D. B. (1993). High-resolution scanning hall probe microscopy. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 1855, pp. 152–157). https://doi.org/10.1117/12.146371
Hallen, H. D., H. F. Hess, A. M. Chang, L. N. Pfeiffer, K. W. West, and D. B. Mitzi. “High-resolution scanning hall probe microscopy.” In Proceedings of SPIE - The International Society for Optical Engineering, 1855:152–57, 1993. https://doi.org/10.1117/12.146371.
Hallen HD, Hess HF, Chang AM, Pfeiffer LN, West KW, Mitzi DB. High-resolution scanning hall probe microscopy. In: Proceedings of SPIE - The International Society for Optical Engineering. 1993. p. 152–7.
Hallen, H. D., et al. “High-resolution scanning hall probe microscopy.” Proceedings of SPIE - The International Society for Optical Engineering, vol. 1855, 1993, pp. 152–57. Scopus, doi:10.1117/12.146371.
Hallen HD, Hess HF, Chang AM, Pfeiffer LN, West KW, Mitzi DB. High-resolution scanning hall probe microscopy. Proceedings of SPIE - The International Society for Optical Engineering. 1993. p. 152–157.

Published In

Proceedings of SPIE - The International Society for Optical Engineering

DOI

10.1117/12.146371

EISSN

1996-756X

ISSN

0277-786X

Publication Date

June 4, 1993

Volume

1855

Start / End Page

152 / 157

Related Subject Headings

  • 5102 Atomic, molecular and optical physics
  • 4009 Electronics, sensors and digital hardware
  • 4006 Communications engineering